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Proceedings Paper

Spectrum photoluminescence measuring system of porous silicon samples
Author(s): T. F. Paes; A. F. Beloto; L. A. Berni; L. M. Silva
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Paper Abstract

The porous silicon is a material made by monocrystalline silicon wafers which has a structure and properties that depends on the wafers characteristics and its obtaining process. The material has a use potential in different fields of knowledge and technological application such as solar cells, humidity or gases sensors. The photoluminescence, obtained by the incidence of ultraviolet radiation over the material, has been the most studied property, noting especially the understanding of chemical and physical phenomena present in this material that can even explain its formation process. This study aimed to build a spectrum measuring system of porous silicon photoluminescence to determine the profile of the porous silicon photoemission curve for comparison between the morphology of the porous silicon and its photoluminescence.

Paper Details

Date Published: 18 November 2013
PDF: 7 pages
Proc. SPIE 8785, 8th Iberoamerican Optics Meeting and 11th Latin American Meeting on Optics, Lasers, and Applications, 8785A9 (18 November 2013); doi: 10.1117/12.2021695
Show Author Affiliations
T. F. Paes, Instituto Nacional de Pesquisas Espaciais (Brazil)
A. F. Beloto, Instituto Nacional de Pesquisas Espaciais (Brazil)
L. A. Berni, Instituto Nacional de Pesquisas Espaciais (Brazil)
L. M. Silva, Instituto Nacional de Pesquisas Espaciais (Brazil)


Published in SPIE Proceedings Vol. 8785:
8th Iberoamerican Optics Meeting and 11th Latin American Meeting on Optics, Lasers, and Applications
Manuel Filipe P. C. Martins Costa, Editor(s)

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