Share Email Print
cover

Proceedings Paper

Computational analysis of detectability metrics from an EMI sensor for target detection and discrimination
Author(s): Isaac Chappell; Robert Kraig; Howard Last
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Many technologies are being developed to improve the detection of buried threats (e.g., landmines) and to discriminate these threats from clutter in an operational environment. Current systems have implemented ground-penetrating radar (GPR) and electromagnetic induction (EMI) sensors. The detection performance of these systems is assessed in field testing, where algorithms are used to determine when a buried threat has been encountered [1]. Similar to work done by Rosen and Ayers [2], this paper focuses on developing a method to study EMI sensor performance independent of any aided target recognition (ATR) algorithm used. Rosen and Ayers developed a method and a simple metric for assessing the mine-detection capabilities of down-looking GPR systems before an ATR algorithm is applied. This paper reports the development of two metrics for a wide-band EMI sensor based on the method used by Rosen and Ayers. In this initial effort, the values of the metrics developed are presented over different targets, and observations are made regarding potential use of this metric.

Paper Details

Date Published: 7 June 2013
PDF: 11 pages
Proc. SPIE 8709, Detection and Sensing of Mines, Explosive Objects, and Obscured Targets XVIII, 87090F (7 June 2013); doi: 10.1117/12.2021678
Show Author Affiliations
Isaac Chappell, Institute for Defense Analyses (United States)
Robert Kraig, Institute for Defense Analyses (United States)
Howard Last, Institute for Defense Analyses (United States)


Published in SPIE Proceedings Vol. 8709:
Detection and Sensing of Mines, Explosive Objects, and Obscured Targets XVIII
J. Thomas Broach; Jason C. Isaacs, Editor(s)

© SPIE. Terms of Use
Back to Top