Share Email Print

Proceedings Paper

A robotized six degree of freedom stage for optical microscopy
Author(s): M. Z. Avramov; I. Ivanov; V. Pavlov; K. Zaharieva
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

This work represents an investigation of the possibility to use a hexapod system for optical microscopy investigation and measurements. An appropriate hexapod stage has been developed. The stage has been calibrated and used for several different optical microscopy applications. The construction of the stage is based on the classic Stewart platform and thus represents a parallel robot with 6 degree of freedom. Appropriate software is controlling the transformation of the 3 position coordinates of the moving plate and the 3 Euler angles in position velocities and accelerations of the plate motion. An embedded microcontroller is implementing the motion plan and the PID controller regulating the kinematics. By difference to the available in the market hexapods the proposed solution is with lower precision but is significantly cheaper and simple to maintain. The repeatability obtained with current implementation is 0,05 mm and 0,001 rad. A specialized DSP based video processing engine is used for both feedback computation and application specific image processing in real-time. To verify the concept some applications has been developed for specific tasks and has been used for specific measurements.

Paper Details

Date Published: 23 May 2013
PDF: 7 pages
Proc. SPIE 8791, Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection, 87910Q (23 May 2013); doi: 10.1117/12.2021461
Show Author Affiliations
M. Z. Avramov, Sofia Univ. "St. Kliment Ohridski" (Bulgaria)
I. Ivanov, Sofia Univ. "St. Kliment Ohridski" (Bulgaria)
V. Pavlov, Sofia Univ. "St. Kliment Ohridski" (Bulgaria)
K. Zaharieva, Sofia Univ. "St. Kliment Ohridski" (Bulgaria)

Published in SPIE Proceedings Vol. 8791:
Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection
Fabio Remondino; Jürgen Beyerer; Fernando Puente León; Mark R. Shortis, Editor(s)

© SPIE. Terms of Use
Back to Top