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Proceedings Paper

An electron beam detector for the FLASH II beam dump
Author(s): J. Good; G. Kube; N. Leuschner; F. Perlick; M. Sachwitz; M. Schmitz; K. Wittenburg; T. Wohlenberg
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Paper Abstract

After the generation of the laser light, a dipole deflects the highly energetic electron beam of FLASH (Free Electron Laser Hamburg) into a dump. A detector is developed to monitor the position, dimensions and profile of the electron beam. Scintillation light is emitted due to the electrons hitting a luminescent screen located in front of the dump aperture. This light is guided by an optical system external to the vacuum to a CCD camera for optical analysis of the generated image. In this paper the layouts of two different optical systems are presented, both of which will be redundantly installed at FLASH II. The conventional lens-mirror-arrangement, consisting of three single collecting lenses, two mirrors and a zoom lens, is supposed to have a theoretical resolution of 0.25 mm. The second optical system is based on radiation-hard optical fibres. For the latter it is planned to test the impact of radiation on the optical qualities of the bundle by installing it into a “radioactive hot spot” at the bunch compressor in the FLASH accelerator. This test setup will also be presented.

Paper Details

Date Published: 3 May 2013
PDF: 8 pages
Proc. SPIE 8778, Advances in X-ray Free-Electron Lasers II: Instrumentation, 87781D (3 May 2013); doi: 10.1117/12.2021392
Show Author Affiliations
J. Good, Deutsches Elektronen-Synchrotron (Germany)
G. Kube, Deutsches Elektronen-Synchrotron (Germany)
N. Leuschner, Deutsches Elektronen-Synchrotron (Germany)
F. Perlick, Deutsches Elektronen-Synchrotron (Germany)
M. Sachwitz, Deutsches Elektronen-Synchrotron (Germany)
M. Schmitz, Deutsches Elektronen-Synchrotron (Germany)
K. Wittenburg, Deutsches Elektronen-Synchrotron (Germany)
T. Wohlenberg, Deutsches Elektronen-Synchrotron (Germany)

Published in SPIE Proceedings Vol. 8778:
Advances in X-ray Free-Electron Lasers II: Instrumentation
Thomas Tschentscher; Kai Tiedtke, Editor(s)

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