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Proceedings Paper

Test case set generation method on MC/DC based on binary tree
Author(s): Jun-jie Wang; Bo Zhang; Yuan Chen
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Paper Abstract

Exploring efficient, reliable test case design methods has been tester pursuit of the goal. Along with the aerospace software logic complexity of improving and software scale enlarging, this requirement also gets more compelling. Test case design techniques suited for MC/DC improved test case design efficiency, increase the test coverage. It is suitable to test the software that logical relationship is complicated comparatively. Some software test tools provide the function to calculate the test coverage. And it can assess the test cases whether on the MC/DC or not. But the software tester needs the reverse thinking. The paper puts forward that design the test case by Unique-cause and Masking approach. And it proposes automatic generation method of test case on MC/DC. It improved the efficiency and correctness of generation the test case set on DC/DC.

Paper Details

Date Published: 13 March 2013
PDF: 5 pages
Proc. SPIE 8783, Fifth International Conference on Machine Vision (ICMV 2012): Computer Vision, Image Analysis and Processing, 87831P (13 March 2013); doi: 10.1117/12.2021188
Show Author Affiliations
Jun-jie Wang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Bo Zhang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate Univ. of the Chinese Academy of Sciences (China)
Yuan Chen, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate Univ. of the Chinese Academy of Sciences (China)


Published in SPIE Proceedings Vol. 8783:
Fifth International Conference on Machine Vision (ICMV 2012): Computer Vision, Image Analysis and Processing
Yulin Wang; Liansheng Tan; Jianhong Zhou, Editor(s)

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