Share Email Print
cover

Proceedings Paper

A simulation study on the inspection of transparent circuits with narrow line widths by using a PDLC/ITO film
Author(s): C.-H. Chan; S.-C. Lin; Y.-T. Zou; C.-T. Chen; T.-K. Liu; C.-H. Chen; H.-W. Wang
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In this study, it is of interest to find a way to inspect transparent circuits with narrow line widths (<30 μm). A PDLC/ITO film with a thinner PET layers (1 and 5 μm) will be adopted as the sensing device. Simulations were conducted to evaluate the performance of the proposed system and study effects of system parameters on the limitation of the proposed system.

Paper Details

Date Published: 22 June 2013
PDF: 10 pages
Proc. SPIE 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 87691E (22 June 2013); doi: 10.1117/12.2021027
Show Author Affiliations
C.-H. Chan, National Tsing Hua Univ. (Taiwan)
S.-C. Lin, National Tsing Hua Univ. (Taiwan)
Y.-T. Zou, Industrial Technology Research Institute (Taiwan)
C.-T. Chen, Industrial Technology Research Institute (Taiwan)
T.-K. Liu, Industrial Technology Research Institute (Taiwan)
C.-H. Chen, Industrial Technology Research Institute (Taiwan)
H.-W. Wang, Industrial Technology Research Institute (Taiwan)


Published in SPIE Proceedings Vol. 8769:
International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013)
Chenggen Quan; Kemao Qian; Anand Asundi, Editor(s)

© SPIE. Terms of Use
Back to Top