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Proceedings Paper

A reference workpiece for voxel size correction in x-ray computed tomography
Author(s): Joseph J. Lifton; Kevin J. Cross; Andrew A. Malcolm; John W. McBride
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Paper Abstract

X-ray computed tomography (CT) is increasingly used for dimensional metrology, allowing the inspection of both interior and exterior features impossible to observe using traditional optical and tactile measurement techniques. X-ray CT offers many benefits over traditional instruments as a visual inspection tool, however, extracting dimensional information from the reconstructed data-sets must be approached with caution due to error sources that can propagate through the image reconstruction processes. One error source originates from values of the source-to-object and source-to-detector distances; these are critical inputs as they define the voxel size, a global scalar directly influencing all dimensions extracted from the data. To reduce voxel size errors a reference workpiece can be scanned using the same measurement settings as the actual workpiece. By reconstructing the reference workpiece a reference dimension can be evaluated and this then used to adjust the voxel size of the actual workpiece. This reference dimension must be threshold independent, namely it is determined without the influence of edge detection thresholds. This paper offers a reference workpiece designed for measurement in an X-ray CT system, a coordinate measuring machine (CMM), and an optical profiler. Repeated measurements are made of the reference workpiece using all three instruments and

Paper Details

Date Published: 22 June 2013
PDF: 8 pages
Proc. SPIE 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 87690E (22 June 2013); doi: 10.1117/12.2020916
Show Author Affiliations
Joseph J. Lifton, Univ. of Southampton (United Kingdom)
Singapore Institute of Manufacturing Technology (Singapore)
Kevin J. Cross, Univ. of Southampton (United Kingdom)
Andrew A. Malcolm, Singapore Institute of Manufacturing Technology (Singapore)
John W. McBride, Univ. of Southampton Malaysia Campus (Malaysia)

Published in SPIE Proceedings Vol. 8769:
International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013)
Chenggen Quan; Kemao Qian; Anand Asundi, Editor(s)

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