Share Email Print
cover

Proceedings Paper

Full characterization of a focused wave field with sub 100 nm resolution
Author(s): Robert Hoppe; Vivienne Meier; Jens Patommel; Frank Seiboth; Hae Ja Lee; Bob Nagler; Eric C. Galtier; Brice Arnold; Ulf Zastrau; Jerome Hastings; Daniel Nilsson; Fredrik Uhlén; Ulrich Voigt; Hans M. Hertz; Christian G. Schroer; Andreas Schropp
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A hard x-ray free-electron laser (XFEL) provides an x-ray source with an extraordinary high peak-brilliance, a time structure with extremely short pulses and with a large degree of coherence, opening the door to new scientific fields. Many XFEL experiments require the x-ray beam to be focused to nanometer dimensions or, at least, benefit from such a focused beam. A detailed knowledge about the illuminating beam helps to interpret the measurements or is even inevitable to make full use of the focused beam. In this paper we report on focusing an XFEL beam to a transverse size of 125nm and how we applied ptychographic imaging to measure the complex wavefield in the focal plane in terms of phase and amplitude. Propagating the wavefield back and forth we are able to reconstruct the full caustic of the beam, revealing aberrations of the nano-focusing optic. By this method we not only obtain the averaged illumination but also the wavefield of individual XFEL pulses.

Paper Details

Date Published: 10 May 2013
PDF: 9 pages
Proc. SPIE 8778, Advances in X-ray Free-Electron Lasers II: Instrumentation, 87780G (10 May 2013); doi: 10.1117/12.2020856
Show Author Affiliations
Robert Hoppe, Technische Univ. Dresden (Germany)
Vivienne Meier, Technische Univ. Dresden (Germany)
Jens Patommel, Technische Univ. Dresden (Germany)
Frank Seiboth, Technische Univ. Dresden (Germany)
Hae Ja Lee, SLAC National Accelerator Lab. (United States)
Bob Nagler, SLAC National Accelerator Lab. (United States)
Eric C. Galtier, SLAC National Accelerator Lab. (United States)
Brice Arnold, SLAC National Accelerator Lab. (United States)
Ulf Zastrau, SLAC National Accelerator Lab. (United States)
Jerome Hastings, SLAC National Accelerator Lab. (United States)
Daniel Nilsson, Royal Institute of Technology (Sweden)
Fredrik Uhlén, Royal Institute of Technology (Sweden)
Ulrich Voigt, Royal Institute of Technology (Sweden)
Hans M. Hertz, Royal Institute of Technology (Sweden)
Christian G. Schroer, Technische Univ. Dresden (Germany)
Andreas Schropp, SLAC National Accelerator Lab. (United States)


Published in SPIE Proceedings Vol. 8778:
Advances in X-ray Free-Electron Lasers II: Instrumentation
Thomas Tschentscher; Kai Tiedtke, Editor(s)

© SPIE. Terms of Use
Back to Top