Share Email Print
cover

Proceedings Paper

Deflectometry vs. interferometry
Author(s): Gerd Häusler; Christian Faber; Evelyn Olesch; Svenja Ettl
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Quantitative deflectometry is a new tool to measure specular surfaces. The spectrum of measurable surfaces ranges from flat to freeform surfaces with steep slopes, with a size ranging from millimeters to several meters. We illustrate this by several applications: eye glass measurements, measurements of big mirrors, and in-line measurements in ultra-precision manufacturing without unclamping of the sample. We describe important properties of deflectometry and compare its potentials and limitations with interferometry. We discuss which method is superior for which application and how the potential of deflectometry may be developing in the future.

Paper Details

Date Published: 13 May 2013
PDF: 11 pages
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881C (13 May 2013); doi: 10.1117/12.2020578
Show Author Affiliations
Gerd Häusler, Univ. of Erlangen-Nuremberg (Germany)
Christian Faber, Univ. of Erlangen-Nuremberg (Germany)
Evelyn Olesch, Univ. of Erlangen-Nuremberg (Germany)
Svenja Ettl, Univ. of Erlangen-Nuremberg (Germany)


Published in SPIE Proceedings Vol. 8788:
Optical Measurement Systems for Industrial Inspection VIII
Peter H. Lehmann; Wolfgang Osten; Armando Albertazzi, Editor(s)

© SPIE. Terms of Use
Back to Top