Share Email Print
cover

Proceedings Paper

Effect of pulse energy and numbers on fused silica surface by ultraviolet laser pulses at 355nm in vacuum
Author(s): Xiaoyan Zhou; Xinda Zhou; Jin Huang; Qiang Cheng; Fengrui Wang; Xin Ye; Xiaodong Jiang; Weidong Wu
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

High–purity fused silica irradiated by UV laser in vacuum with different laser pulse parameters were studied experimentally. The defects induced by UV laser are investigated by UV absorption, fluorescence spectra and the structural modifications in the glass matrix are characterized by Raman spectra. Results show that, for laser fluence below the laser–induced damage threshold (LIDT), irradiation results in the formation of an absorption band and four defect–related fluorescence (FL) bands, and the intensities of absorption band and FL bands were increased with laser power and/or number of laser pulses. The optical properties of these point defects were discussed in detail. Analyzed these spectra, it indicates that the presence of different centers whose spectral features are modulated by structural disorder typical of the glass matrix.

Paper Details

Date Published: 9 July 2013
PDF: 13 pages
Proc. SPIE 8786, Pacific Rim Laser Damage 2013: Optical Materials for High Power Lasers, 87860O (9 July 2013); doi: 10.1117/12.2020378
Show Author Affiliations
Xiaoyan Zhou, China Academy of Engineering Physics (China)
Xinda Zhou, China Academy of Engineering Physics (China)
Jin Huang, China Academy of Engineering Physics (China)
Qiang Cheng, China Academy of Engineering Physics (China)
Fengrui Wang, China Academy of Engineering Physics (China)
Xin Ye, China Academy of Engineering Physics (China)
Xiaodong Jiang, China Academy of Engineering Physics (China)
Weidong Wu, China Academy of Engineering Physics (China)


Published in SPIE Proceedings Vol. 8786:
Pacific Rim Laser Damage 2013: Optical Materials for High Power Lasers
Jianda Shao; Takahisa Jitsuno; Wolfgang Rudolph, Editor(s)

© SPIE. Terms of Use
Back to Top