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Proceedings Paper

Femtosecond to nanosecond laser damage in dielectric materials
Author(s): W. Rudolph; L. A. Emmert; C. Rodriguez; Z. Sun; X. Zhang; Y. Xu; C. S. Menoni; P. F. Langston; E. Krous; D. Patel
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Paper Abstract

We present a consistent model supported by experimental data of damage of dielectric films by femtosecond to nanosecond pulses. Special emphasis is given to the role of defects and transient processes in the material. New imaging and diagnostic techniques are discussed to characterize the film performance.

Paper Details

Date Published: 9 July 2013
PDF: 7 pages
Proc. SPIE 8786, Pacific Rim Laser Damage 2013: Optical Materials for High Power Lasers, 878602 (9 July 2013); doi: 10.1117/12.2020356
Show Author Affiliations
W. Rudolph, The Univ. of New Mexico (United States)
L. A. Emmert, The Univ. of New Mexico (United States)
C. Rodriguez, The Univ. of New Mexico (United States)
Z. Sun, The Univ. of New Mexico (United States)
X. Zhang, The Univ. of New Mexico (United States)
Y. Xu, The Univ. of New Mexico (United States)
C. S. Menoni, Colorado State Univ. (United States)
P. F. Langston, Colorado State Univ. (United States)
E. Krous, Colorado State Univ. (United States)
D. Patel, Colorado State Univ. (United States)


Published in SPIE Proceedings Vol. 8786:
Pacific Rim Laser Damage 2013: Optical Materials for High Power Lasers
Jianda Shao; Takahisa Jitsuno; Wolfgang Rudolph, Editor(s)

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