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Proceedings Paper

Parallelized chromatic confocal sensor systems
Author(s): Matthias Hillenbrand; Adrian Grewe; Mohamed Bichra; Roman Kleindienst; Lucia Lorenz; Raoul Kirner; Robert Weiß; Stefan Sinzinger
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Paper Abstract

In this paper we present chromatic confocal distance sensors for the parallelized evaluation at several lateral positions. The multi-point measurements are performed using either one- or two-dimensional detector arrays. The first sensor combines the concepts of confocal matrix sensing and snapshot hyperspectral imaging to image a two-dimensional array of laterally separated points with one single shot. In contrast to chromatic confocal matrix sensors which use an RGB detector our system works independently from the spectral reflectivity of the surface under test and requires no object-specific calibration. Our discussion of this sensor principle is supported by experimental results. The second sensor is a multipoint line sensor aimed at high speed applications with frame rates of several thousand frames per second. To reach this evaluation speed a one-dimensional detector is employed. We use spectral multiplexing to transfer the information from different measurement points through a single fiber and evaluate the spectral distribution with a conventional spectrometer. The working principle of the second sensor type is demonstrated for the example of a three-point sensor.

Paper Details

Date Published: 13 May 2013
PDF: 10 pages
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880V (13 May 2013); doi: 10.1117/12.2020334
Show Author Affiliations
Matthias Hillenbrand, Technische Univ. Ilmenau (Germany)
Adrian Grewe, Technische Univ. Ilmenau (Germany)
Mohamed Bichra, Technische Univ. Ilmenau (Germany)
Roman Kleindienst, Technische Univ. Ilmenau (Germany)
Lucia Lorenz, Technische Univ. Ilmenau (Germany)
Raoul Kirner, Technische Univ. Ilmenau (Germany)
Robert Weiß, Technische Univ. Ilmenau (Germany)
Stefan Sinzinger, Technische Univ. Ilmenau (Germany)


Published in SPIE Proceedings Vol. 8788:
Optical Measurement Systems for Industrial Inspection VIII
Peter H. Lehmann; Wolfgang Osten; Armando Albertazzi, Editor(s)

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