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Proceedings Paper

3D atomic scale chemistry of gallium nitride materials and devices studied by atom probe tomography
Author(s): George D. D. W. Smith; M. Müller; Alfred Cerezo; B. Gault; D. W. Saxey; P. A. A. J. Bagot; M. P. Moody; S. E. Bennett; Rachel A. Oliver; Colin J. Humphreys
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Paper Details

Date Published:
Proc. SPIE 8625, Gallium Nitride Materials and Devices VIII, 86250H; doi: 10.1117/12.2020295
Show Author Affiliations
George D. D. W. Smith, Univ. of Oxford (United Kingdom)
M. Müller, Univ. of Oxford (United Kingdom)
Alfred Cerezo, Univ. of Oxford (United Kingdom)
B. Gault, Univ. of Oxford (United Kingdom)
D. W. Saxey, Univ. of Oxford (United Kingdom)
P. A. A. J. Bagot, Univ. of Oxford (United Kingdom)
M. P. Moody, Univ. of Oxford (United Kingdom)
S. E. Bennett, Univ. of Cambridge (United Kingdom)
Rachel A. Oliver, Univ. of Cambridge (United Kingdom)
Colin J. Humphreys, Univ. of Cambridge (United Kingdom)

Published in SPIE Proceedings Vol. 8625:
Gallium Nitride Materials and Devices VIII
Jen-Inn Chyi; Yasushi Nanishi; Hadis Morkoç; Joachim Piprek; Euijoon Yoon; Hiroshi Fujioka, Editor(s)

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