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Proceedings Paper

Dynamic measurement for the solution concentration variation using digital holographic interferometry and discussion for the measuring accuracy
Author(s): Jianlin Zhao; Yanyan Zhang; Hongzhen Jiang; Jianglei Di
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Paper Abstract

Based on digital holographic interferometry (DHI), a method for dynamically measuring the solution concentration variation is introduced. Firstly, a series of digital holograms containing the information of the solution concentration variation is recorded by CCD. Then, according to the relationship between the phase change of the reconstructed object wave and the solution concentration, the two-dimensional (2D) solution concentration distributions in different time are figured out. Taking the measurement of the solution concentration in crystallization process as a sample, the experimental results turn out that it is feasible to in situ, full-field and dynamically monitor the solution concentration variation with the proposed method. We also discuss how to assure the measurement accuracy in following aspects: (1) implementation of the phase correction to eliminate the influence of the environment for the measurement process; (2) determination of the phase calibration base in the space-domain phase unwrapping process according to the time-domain phase unwrapping result of the arbitrary point in solution; (3) the experimental approaches and analysis for improving the measurement accuracy.

Paper Details

Date Published: 22 June 2013
PDF: 8 pages
Proc. SPIE 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 87690D (22 June 2013); doi: 10.1117/12.2020155
Show Author Affiliations
Jianlin Zhao, Northwestern Polytechnical Univ. (China)
Yanyan Zhang, Northwestern Polytechnical Univ. (China)
Hongzhen Jiang, Northwestern Polytechnical Univ. (China)
Jianglei Di, Northwestern Polytechnical Univ. (China)


Published in SPIE Proceedings Vol. 8769:
International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013)
Chenggen Quan; Kemao Qian; Anand Asundi, Editor(s)

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