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Proceedings Paper

Transverse stimulated Raman scattering gain coefficient measurement in KDP crystal
Author(s): Yajing Guo; Shunxing Tang; Hongchao Hui; Yuyu Wang; Qing Tang; Baoqiang Zhu; Zunqi Lin
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Paper Abstract

Transverse stimulated Raman scattering (TSRS) gain coefficient of a KDP sample is measured by improved methods. The improvements include color separation of TSRS, noise light management and acquisition of valid TSRS temporal pulse. After extracting TSRS temporal pulse and data analysis, we obtained a TSRS gain coefficient of 0.28±0.03cm/GW for the KDP sample. Our improvements of measurement method include the following three aspects: First, the separation of TSRS irradiation (362.2nm) from Rayleigh irradiation (351.15nm) is realized by first-order diffraction of grating for TSRS and Rayleigh. Second, to improve the ratio of TSRS signal and noise light owing to spurious reflection of pump radiation, we remove noise light by using band-pass filter and absorption traps. Third, by analyzing the time delay between pump signal and noise signal, we demonstrates the valid TSRS temporal pulse can be extracted from the noise signal and used to calculate the TSRS gain coefficient of KDP.

Paper Details

Date Published: 9 July 2013
PDF: 8 pages
Proc. SPIE 8786, Pacific Rim Laser Damage 2013: Optical Materials for High Power Lasers, 87860U (9 July 2013); doi: 10.1117/12.2020127
Show Author Affiliations
Yajing Guo, Shanghai Institute of Optics and Fine Mechanics (China)
Shunxing Tang, Shanghai Institute of Optics and Fine Mechanics (China)
Hongchao Hui, Shanghai Institute of Optics and Fine Mechanics (China)
Yuyu Wang, Shanghai Institute of Optics and Fine Mechanics (China)
Qing Tang, Shanghai Institute of Optics and Fine Mechanics (China)
Baoqiang Zhu, Shanghai Institute of Optics and Fine Mechanics (China)
Zunqi Lin, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 8786:
Pacific Rim Laser Damage 2013: Optical Materials for High Power Lasers
Jianda Shao; Takahisa Jitsuno; Wolfgang Rudolph, Editor(s)

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