Share Email Print
cover

Proceedings Paper

Design and experiment of testing an off-axis aspheric surface by computer generated hologram
Author(s): Shijie Li; Fan Wu; Qiang Chen; Bin Fan; Lianghong Li
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

To test an off-axis aspheric surface in high precision, a multiple combined computer generated hologram (CGH) is designed and fabrication. Multiple combined CGH which is a hologram including different areas with different purposes can not only measure off-axis aspheric surface, but also align every element in test system. The design methods of test CGH and alignment CGH were deduced in detail. Ray trace and B-spline were used to devise test CGH, reflection CGH was used to align interferometer and CGH, and hologram alignment mark was used to align CGH and off-axis aspheric surface. A design example was given to test an off-axis paraboloid with 50mm aperture and 35mm off-axis distance. Meanwhile, this CGH was fabricated and this paraboloid was measured by it. The test result (PV=0.305λ,RMS=0.042λ) is matched well with the outcome verified by autocollimation (PV=0.320λ,RMS=0.043λ). At last, we analyzed and solved the noise in the CGH test result. It proves that these designs are correct and this method can test off-axis aspheric surface in high precision.

Paper Details

Date Published: 13 May 2013
PDF: 9 pages
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878833 (13 May 2013); doi: 10.1117/12.2019345
Show Author Affiliations
Shijie Li, Institute of Optics and Electronics (China)
Univ. of Chinese Academy of Sciences (China)
Fan Wu, Institute of Optics and Electronics (China)
Qiang Chen, Institute of Optics and Electronics (China)
Bin Fan, Institute of Optics and Electronics (China)
Lianghong Li, Institute of Optics and Electronics (China)


Published in SPIE Proceedings Vol. 8788:
Optical Measurement Systems for Industrial Inspection VIII
Peter H. Lehmann; Wolfgang Osten; Armando Albertazzi, Editor(s)

© SPIE. Terms of Use
Back to Top