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Proceedings Paper

Micro-focusing of soft X-ray pulses by grazing-incidence toroidal mirrors
Author(s): Luca Poletto; Fabio Frassetto; Sunilkumar Anumula; Francesca Calegari; Andrea Trabattoni; Mauro Nisoli
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Paper Abstract

The design of optical systems for micro-focusing of extreme-ultraviolet (XUV) and soft X-ray pulses through grazingincidence toroidal mirrors is presented. Aim of the configuration here presented is to provide a micro-focused image through a high demagnification of the source with almost negligible aberrations and a long exit arm to accommodate at the output a large experimental chamber. We present the analytical and numerical study of two configurations to fulfill these requirements with two toroidal mirrors. The first mirror provides a demagnified image of the source in the intermediate plane that is free from defocusing but has a large coma aberration, the second mirror is mounted in Z-shaped geometry with respect to the previous one, in order to give a stigmatic image with a coma that is opposite to that provided by the first one. Some examples are provided to demonstrate the capability to achieve spot sizes in the 5-15 μm range both applied to high-order laser harmonics and free-electron-laser radiation.

Paper Details

Date Published: 3 May 2013
PDF: 9 pages
Proc. SPIE 8778, Advances in X-ray Free-Electron Lasers II: Instrumentation, 877813 (3 May 2013); doi: 10.1117/12.2019247
Show Author Affiliations
Luca Poletto, CNR, Institute of Photonics and Nanotechnologies, Politecnico di Milano (Italy)
Fabio Frassetto, CNR, Institute of Photonics and Nanotechnologies, Politecnico di Milano (Italy)
Sunilkumar Anumula, CNR, Institute of Photonics and Nanotechnologies, Politecnico di Milano (Italy)
Francesca Calegari, CNR, Institute of Photonics and Nanotechnologies, Politecnico di Milano (Italy)
Andrea Trabattoni, CNR, Institute of Photonics and Nanotechnologies, Politecnico di Milano (Italy)
Mauro Nisoli, CNR, Institute of Photonics and Nanotechnologies, Politecnico di Milano (Italy)


Published in SPIE Proceedings Vol. 8778:
Advances in X-ray Free-Electron Lasers II: Instrumentation
Thomas Tschentscher; Kai Tiedtke, Editor(s)

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