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Proceedings Paper

High-performance bias-selectable dual-band short-/mid-wavelength infrared photodetectors and focal plane arrays based on InAs/GaSb/AlSb Type-II superlattices
Author(s): M. Razeghi; A. M. Hoang; A. Haddadi; G. Chen; S. Ramezani-Darvish; P. Bijjam; P. Wijewarnasuriya; E. Decuir
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Paper Abstract

We report a bias selectable dual-band Type-II superlattice-based short-wave infrared (SWIR) and mid-wave infrared (MWIR) co-located photodetector capable of active and passive imaging. A new double-layer etch-stop scheme is introduced for back-side-illuminated photodetectors, which enhanced the external quantum efficiency both in the SWIR and MWIR spectral regions. Temperature-dependent dark current measurements of pixel-sized 27 μm detectors found the dark current density to be ~1×10-5 A/cm2 for the ∼4.2 μm cut-off MWIR channel at 140 K. This corresponded to a reasonable imager noise equivalent difference in temperature of ∼49 mK using F⁄2.3 optics and a 10 ms integration time (tint), which lowered to ∼13 mK at 110 K using and integration time of 30 ms, illustrating the potential for high-temperature operation. The SWIR channel was found to be limited by readout noise below 150 K. An excellent imagery from the dual-band imager exemplifying pixel coincidence is shown.

Paper Details

Date Published: 18 June 2013
PDF: 5 pages
Proc. SPIE 8704, Infrared Technology and Applications XXXIX, 87041W (18 June 2013); doi: 10.1117/12.2019145
Show Author Affiliations
M. Razeghi, Northwestern Univ. (United States)
A. M. Hoang, Northwestern Univ. (United States)
A. Haddadi, Northwestern Univ. (United States)
G. Chen, Northwestern Univ. (United States)
S. Ramezani-Darvish, Northwestern Univ. (United States)
P. Bijjam, Northwestern Univ. (United States)
P. Wijewarnasuriya, U.S. Army Research Lab. (United States)
E. Decuir, U.S. Army Research Lab. (United States)


Published in SPIE Proceedings Vol. 8704:
Infrared Technology and Applications XXXIX
Bjørn F. Andresen; Gabor F. Fulop; Charles M. Hanson; Paul R. Norton; Patrick Robert, Editor(s)

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