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Proceedings Paper

Single image method to depict 3D profiles
Author(s): Mahesh Kondiparthi
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Paper Abstract

A method to reliably extract object profiles even with surface discontinuities (that leads to 2nπphase jumps) is proposed. Proposed method uses an amplitude modulated Ronchi grating, which facilitates one to extract phase and unwrap the same with a single image. The modified grating image can be split into two images, one aids in extracting the wrapped phase using Fourier transform profilometry, and the other aids in reliable phase unwrapping. As we only need a grayscale projector that projects amplitude modulated grating, proposed method facilitates one to extract 3D profile without using full video projectors.

Paper Details

Date Published: 8 March 2013
PDF: 12 pages
Proc. SPIE 8618, Emerging Digital Micromirror Device Based Systems and Applications V, 86180J (8 March 2013); doi: 10.1117/12.2019089
Show Author Affiliations
Mahesh Kondiparthi, Indian Institute of Science (India)


Published in SPIE Proceedings Vol. 8618:
Emerging Digital Micromirror Device Based Systems and Applications V
Michael R. Douglass; Patrick I. Oden, Editor(s)

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