Share Email Print
cover

Proceedings Paper

Interferometrical techniques for the investigation of dynamic events
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The availability of high resolution CCD and CMOS sensors together with the increasing computer capacity have enabled the development of different interferometrical techniques (speckle interferometry, digital holography, digital sherography) which are well suited for real time measurements. Two or more interferograms are recorded on a digital sensor at different times and the deformation of the object occurring between the exposures is calculated from the phase change. Since the process to investigate can be very fast we cannot use the well-known temporal phase shift method for the determination of the phase but we use a spatial carrier method which allows to determine that phase from one single hologram. We will show that this method can be used as well for shearography. Applications of digital holographic techniques for the investigation of vibrations, defect detection in mechanical structure and time resolved measurement of deformation of microelectromechanical systems (MEMS) are presented together with some investigation of mechanical structures by using digital shearography with spatial carrier.

Paper Details

Date Published: 22 June 2013
PDF: 9 pages
Proc. SPIE 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 876915 (22 June 2013); doi: 10.1117/12.2019053
Show Author Affiliations
Giancarlo Pedrini, Univ. Stuttgart (Germany)
Igor Alexeenko, Immanuel Kant Baltic Federal Univ. (Russian Federation)
Wolfgang Osten, Univ. Stuttgart (Germany)


Published in SPIE Proceedings Vol. 8769:
International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013)
Chenggen Quan; Kemao Qian; Anand Asundi, Editor(s)

© SPIE. Terms of Use
Back to Top