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Proceedings Paper

Measurement of two-dimensional distribution of temperature with surface plasmon resonance
Author(s): Yen-Chang Chu; Kun-Huang Chen; Jiun-You Lin; Jing-Heng Chen; Huang-Sen Chiu; Tsung-Min Chen
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Paper Abstract

This study proposes a simple method for measuring two-dimensional temperature distributions. Using the significant phase difference between p- and s-polarizations of the reflected light of a surface plasmon resonance (SPR) detector, the variation in the phase difference, which is caused by a variation in the temperature, can be accurately measured by phase-shifting interferometry. Then, by substituting the phase distribution into special derived equation, the temperature distribution can be determined. In order to show the feasibility of this method, different temperature distributions were measured. The measurement resolution is about 0.186°C. Due to the introduced common-path configuration and the high-sensitivity characteristic of surface plasmon resonance, this method should have merits of easy operation, high sensitivity, high accuracy and rapidly measurement.

Paper Details

Date Published: 22 June 2013
PDF: 6 pages
Proc. SPIE 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 87692T (22 June 2013); doi: 10.1117/12.2018985
Show Author Affiliations
Yen-Chang Chu, Feng Chia Univ. (Taiwan)
Kun-Huang Chen, Feng Chia Univ. (Taiwan)
Jiun-You Lin, National Changhua Univ. of Education (Taiwan)
Jing-Heng Chen, Feng Chia Univ. (Taiwan)
Huang-Sen Chiu, Lunghwa Univ. of Science and Technology (Taiwan)
Tsung-Min Chen, Feng Chia Univ. (Taiwan)


Published in SPIE Proceedings Vol. 8769:
International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013)
Chenggen Quan; Kemao Qian; Anand Asundi, Editor(s)

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