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Proceedings Paper

Design of a novel pulse current source chip used in phase change memory testing system
Author(s): Qian Wang; Houpeng Chen; Weiyi Xu; Xiao Hong; Daolin Cai; Rong Jin; Zhitang Song
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Paper Abstract

Circuit design of an adaptable pulse current source chip is presented in this paper. The pulse current source is supposed to be used to supply Reset and Set current in the phase change memory chip testing system. The value and width of the pulse current source are variable, with the maximum value of 10mA and minimum width of 50ns. Two pulse currents output simultaneously with the same width but different values. A voltage pulse input is used to control the width of pulse current output. This high frequency voltage pulse could induce noise jamming to the inner circuits. To avoid this, a novel ESD and bonding structure is proposed.

Paper Details

Date Published: 24 January 2013
PDF: 8 pages
Proc. SPIE 8782, 2012 International Workshop on Information Storage and Ninth International Symposium on Optical Storage, 878216 (24 January 2013); doi: 10.1117/12.2018715
Show Author Affiliations
Qian Wang, Shanghai Institute of Microsystem and Information Technology (China)
Houpeng Chen, Shanghai Institute of Microsystem and Information Technology (China)
Weiyi Xu, Shanghai Institute of Microsystem and Information Technology (China)
Xiao Hong, Shanghai Institute of Microsystem and Information Technology (China)
Daolin Cai, Shanghai Institute of Microsystem and Information Technology (China)
Rong Jin, Shanghai Institute of Microsystem and Information Technology (China)
Zhitang Song, Shanghai Institute of Microsystem and Information Technology (China)


Published in SPIE Proceedings Vol. 8782:
2012 International Workshop on Information Storage and Ninth International Symposium on Optical Storage
Fuxi Gan; Zhitang Song, Editor(s)

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