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Proceedings Paper

Near infrared non-destructive inspection of inner qualities by multivariate analysis
Author(s): Chih-Wen Chen; Yih-Shing Lee; Shang-Ping Ying; Chien-Kuo Ku; Ming-Ying Hsu
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Paper Abstract

In this study, multivariate data analysis, especially partial least squares regression (PLSR), is applied to analyze the near infrared absorbance spectra of fruit samples in order to acquire the inner qualities without destroying the samples. The calibration models have been established for the samples with raw data, first order derivative and second order derivative treatments, respectively. In the meantime, the models have been verified by using cross validation method. As anticipated, a model with higher correlation coefficient (r) and lower root mean square error of calibration (RMSEC) is preferred for both calibration and cross validation. The results reveal that the calibration models with second order derivative treatments have higher correlation coefficient, coefficient of determination, as well as lower RMSEC. Furthermore, the calibration models have been optimized by selecting partial wavelengths as new variables based on absorbance spectra and regression coefficient. The reasons why the calibration models are improved might be suitably cutting off partial wavelengths causing noises in the model.

Paper Details

Date Published: 22 June 2013
PDF: 7 pages
Proc. SPIE 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 87692P (22 June 2013); doi: 10.1117/12.2018603
Show Author Affiliations
Chih-Wen Chen, Instrument Technology Research Ctr. (Taiwan)
Yih-Shing Lee, Minghsin Univ. of Science and Technology (Taiwan)
Shang-Ping Ying, Minghsin Univ. of Science and Technology (Taiwan)
Chien-Kuo Ku, Taipei Municipal Univ. of Education (Taiwan)
Ming-Ying Hsu, Instrument Technology Research Ctr. (Taiwan)


Published in SPIE Proceedings Vol. 8769:
International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013)
Chenggen Quan; Kemao Qian; Anand Asundi, Editor(s)

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