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Proceedings Paper • Open Access

Bringing students to the mountain: developing partnerships to introduce students to cutting-edge research
Author(s): Anne Lynn Gillian-Daniel; Robert J. Gordon; Benjamin L. Taylor; Jon J. McCarthy

Paper Abstract

Many materials science education and outreach activities are designed to be easy and cost-effective to implement in K- 12 classrooms. While these activities are extremely effective at teaching broad materials science concepts such as size and scale, materials properties, and the use of tools in science, they do not connect very closely to the work being done in materials science research laboratories. In an effort to more closely connect our outreach efforts to the work being done by our researchers, the University of Wisconsin–Madison’s Materials Research Science and Engineering Center (UW-MRSEC) has developed a partnership with Hitachi High Technologies America, Inc. This partnership allows us to introduce public audiences to a state-of-the-art tabletop scanning electron microscope (SEM) that is being used by UW researchers. In this paper, we describe the partnership including the use of the SEM in our Research Experience for Teachers (RET) program and in our community outreach programs.

Paper Details

Date Published: 29 May 2013
PDF: 6 pages
Proc. SPIE 8729, Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 87290C (29 May 2013); doi: 10.1117/12.2018232
Show Author Affiliations
Anne Lynn Gillian-Daniel, Univ. of Wisconsin-Madison (United States)
Robert J. Gordon, Hitachi High Technologies America, Inc. (United States)
Benjamin L. Taylor, Univ. of Wisconsin-Madison (United States)
Jon J. McCarthy, Univ. of Wisconsin-Madison (United States)


Published in SPIE Proceedings Vol. 8729:
Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
Michael T. Postek; Dale E. Newbury; S. Frank Platek; Tim K. Maugel, Editor(s)

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