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Proceedings Paper

Full-field displacement measurement by double symmetrical illumination through reflection holograms
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Paper Abstract

Compact and stable phase stepping interferometer for shape and full field displacement measurement in static and in “real time” operation mode is presented. Double symmetrical illumination of the object in two orthogonal planes with diode lasers, emitting in NIR (790 nm and 830 nm), through a four-exposure reflective holographic optical element (Denisiyk’s volume reflection holograms of a reference plane) is applied. Phase stepping is introduced simply by precise increments of the diode lasers current. The proposed system is very stable against external noise, produced by vibrations, temperature changes, air flows, as well as against the influence of object’s “rigid body” motion, as the compact and low weight interferometer can be stably fixed directly onto the measured construction.

Paper Details

Date Published: 22 June 2013
PDF: 9 pages
Proc. SPIE 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 87691A (22 June 2013); doi: 10.1117/12.2017990
Show Author Affiliations
V. Sainov, Institute of Optical Materials and Technologies (Bulgaria)
A. Baldjiev, Institute of Optical Materials and Technologies (Bulgaria)
E. Stoykova, Institute of Optical Materials and Technologies (Bulgaria)


Published in SPIE Proceedings Vol. 8769:
International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013)
Chenggen Quan; Kemao Qian; Anand Asundi, Editor(s)

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