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Proceedings Paper

Results from single shot grazing incidence hard x-ray damage measurements conducted at the SACLA FEL
Author(s): Andrew Aquila; Cigdem Ozkan; Ryszard Sobierajski; Vera Hájková; Tomás Burian; Jakub Chalupsky; Libor Juha; Michael Störmer; Haruhiko Ohashi; Takahisa Koyama; Kensuke Tono; Yuichi Inubushi; Makina Yabashi; Harald Sinn; Thomas Tschentscher; Adrian P. Mancuso; Jérôme Gaudin
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Paper Abstract

With the development of hard X-ray free electron lasers, there is a pressing need to experimentally determine the single shot damage limits of presently used and potential future optical coating materials. To this end we present damage results, and analysis of fluence threshold limits, from grazing incidence geometry experiments conducted at the Spring-8 Angstrom Compact free electron LAser (SACLA) on Carbon coatings at 7 and 12 keV photon energies.

Paper Details

Date Published: 3 May 2013
PDF: 4 pages
Proc. SPIE 8777, Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III, 87770H (3 May 2013); doi: 10.1117/12.2017725
Show Author Affiliations
Andrew Aquila, European XFEL GmbH (Germany)
Cigdem Ozkan, European XFEL GmbH (Germany)
Ryszard Sobierajski, Institute of Physics, Polish Academy of Science (Poland)
Vera Hájková, Institute of Physics of the ASCR, v.v.i. (Czech Republic)
Tomás Burian, Institute of Physics of the ASCR, v.v.i. (Czech Republic)
Jakub Chalupsky, Institute of Physics of the ASCR, v.v.i. (Czech Republic)
Libor Juha, Institute of Physics of the ASCR, v.v.i. (Czech Republic)
Michael Störmer, Helmholtz-Zentrum Geesthacht (Germany)
Haruhiko Ohashi, Japan Synchrotron Radiation Research Institute (Japan)
RIKEN (Japan)
Takahisa Koyama, Japan Synchrotron Radiation Research Institute (Japan)
Kensuke Tono, Japan Synchrotron Radiation Research Institute (Japan)
Yuichi Inubushi, RIKEN (Japan)
Makina Yabashi, RIKEN (Japan)
Harald Sinn, European XFEL GmbH (Germany)
Thomas Tschentscher, European XFEL GmbH (Germany)
Adrian P. Mancuso, European XFEL GmbH (Germany)
Jérôme Gaudin, Univ. of Bordeaux (France)


Published in SPIE Proceedings Vol. 8777:
Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III
Libor Juha; René Hudec; Ladislav Pina; Saša Bajt; Richard London, Editor(s)

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