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Proceedings Paper

Optical performance, structure, and thermal stability of Al/Zr multilayers working at above 17nm
Author(s): Zhanshan Wang; Qi Zhong; Zhong Zhang; Jingtao Zhu; Yuhong Bai; Philippe Jonnard; Karine Le Guen; Jean-Michel Andre
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Paper Abstract

We report on further development of the optical, structural performances and temporal stability of Al(1%wtSi)/Zr multilayers. The multilayers with variable periods (from 10 to 80) are fitted by four-layer model. Below 40 periods, the surface and interfacial roughnesses are increased with the period numbers, but not decrease the reflectivity of Al(1%wtSi)/Zr multilayers. Above 40 periods, such as 80 periods, the reflectivity is down to 34.7% due to larger roughness and worse interfacial boundary. To improve the reflectivity, we modify some parameters during deposition process. The results in the EUV reflectivity show that the reflectivity of the sample with 40 periods is increased from 41.2% to 48.2%. The temporal stability of Al(1%wtSi)/Zr samples with different annealing temperatures has been observed over 35 days.

Paper Details

Date Published: 3 May 2013
PDF: 9 pages
Proc. SPIE 8777, Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III, 87771F (3 May 2013); doi: 10.1117/12.2017590
Show Author Affiliations
Zhanshan Wang, Tongji Univ. (China)
Qi Zhong, Tongji Univ. (China)
Zhong Zhang, Tongji Univ. (China)
Jingtao Zhu, Tongji Univ. (China)
Yuhong Bai, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Philippe Jonnard, Lab. de Chimie Physique-Matière et Rayonnement, CNRS, Univ. Pierre et Marie Curie (France)
Karine Le Guen, Lab. de Chimie Physique-Matière et Rayonnement, CNRS, Univ. Pierre et Marie Curie (France)
Jean-Michel Andre, Lab. de Chimie Physique-Matière et Rayonnement, CNRS, Univ. Pierre et Marie Curie (France)


Published in SPIE Proceedings Vol. 8777:
Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III
Libor Juha; René Hudec; Ladislav Pina; Saša Bajt; Richard London, Editor(s)

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