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Proceedings Paper

Multiple pulse damage in Mo/Si multilayer optics irradiated by intense short-wavelength FELs
Author(s): Ryszard Sobierajski; Rolf A. Loch; Eric Louis; Dorota Klinger; Piotr Dłużewski; Marcin Klepka; Fred Bijkerk; Tomas Burian; Jaromir Chalupsky; Shafagh Dastjani Farahani; Vera Hajkova; Marion Harmand; Jacek Krzywinski; Libor Juha; Stefan P. Moeller; Jerome Gaudin; Andrzej Wawro
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Proc. SPIE 8777, Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III, 87770G; doi: 10.1117/12.2017543
Show Author Affiliations
Ryszard Sobierajski, Institute of Physics PAS (Poland)
Rolf A. Loch, FOM-Institute DIFFER - Dutch Institute for Fundamental Energy Research (Netherlands)
Eric Louis, FOM-Institute DIFFER - Dutch Institute for Fundamental Energy Research (Netherlands)
MESA+ Institute for Nanotechnology, University of Twente (Netherlands)
Dorota Klinger, Institute of Physics PAS (Poland)
Piotr Dłużewski, Institute of Physics PAS (Poland)
Marcin Klepka, FOM-Institute DIFFER - Dutch Institute for Fundamental Energy Research (Netherlands)
Fred Bijkerk, FOM-Institute DIFFER - Dutch Institute for Fundamental Energy Research (Netherlands)
MESA+ Institute for Nanotechnology, University of Twente (Netherlands)
Tomas Burian, Institute of Physics AS CR (Czech Republic)
Jaromir Chalupsky, Institute of Physics AS CR (Czech Republic)
Shafagh Dastjani Farahani, European XFEL GmbH (Germany)
Vera Hajkova, Institute of Physics AS CR (Czech Republic)
Marion Harmand, HASYLAB, DESY (Germany)
Jacek Krzywinski, SLAC National Accelerator Laboratory (United States)
Libor Juha, Institute of Physics AS CR (Czech Republic)
Stefan P. Moeller, SLAC National Accelerator Laboratory (United States)
Jerome Gaudin, European XFEL GmbH (Germany)
Andrzej Wawro, Institute of Physics PAS (Poland)


Published in SPIE Proceedings Vol. 8777:
Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III
Libor Juha; Saša Bajt; Richard London; René Hudec; Ladislav Pina, Editor(s)

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