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Proceedings Paper

Multilayer reflective polarizers for the far ultraviolet
Author(s): Juan I. Larruquert; José A. Aznárez; Luis Rodríguez-de Marcos; José A. Méndez; A. Marco Malvezzi; Angelo Giglia; Paolo Miotti; Fabio Frassetto; Giuseppe Massone; Stefano Nannarone; Giuseppe Crescenzio; Gerardo Capobianco; Silvano Fineschi
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Paper Abstract

Polarimetry in the far ultraviolet (FUV) is a powerful tool for the interpretation of the role of the coronal plasma in the energy transfer processes from the inner parts of the Sun to the outer space. FUV polarimetry from space provides more accurate observations on the kinetics of the features and on local magnetic fields through the Doppler and Hanle resonant electron scattering effects. Particularly interesting lines for FUV polarimetry are H Lyman α (121.6 nm) and β (102.6 nm), along with OVI lines at 103.2 and 103.8 nm. One key element to perform polarimetry measurements at these wavelengths is the need of efficient polarizers. A limitation of the available polarizers, such as crystal plates of MgF2 and LiF working at Brewster angle, is their moderate reflectance at the non-extinguished component of the electric field, which results in a modest polarizer efficiency.

Paper Details

Date Published: 3 May 2013
PDF: 10 pages
Proc. SPIE 8777, Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III, 87771D (3 May 2013); doi: 10.1117/12.2017444
Show Author Affiliations
Juan I. Larruquert, GOLD-Instituto de Óptica, Consejo Superior de Investigaciones Científicas (Spain)
José A. Aznárez, GOLD-Instituto de Óptica, Consejo Superior de Investigaciones Científicas (Spain)
Luis Rodríguez-de Marcos, GOLD-Instituto de Óptica, Consejo Superior de Investigaciones Científicas (Spain)
José A. Méndez, GOLD-Instituto de Óptica, Consejo Superior de Investigaciones Científicas (Spain)
A. Marco Malvezzi, Univ. degli Studi di Pavia (Italy)
Angelo Giglia, CNR, Istituto Officina dei Materiali (Italy)
Paolo Miotti, CNR, Istituto di Fotonica e Nanotecnologie (Italy)
Fabio Frassetto, CNR, Istituto di Fotonica e Nanotecnologie (Italy)
Giuseppe Massone, INAF - Osservatorio Astronomico di Torino (Italy)
Stefano Nannarone, Univ. di Modena e Reggio Emilia (Italy)
Giuseppe Crescenzio, INAF - Osservatorio Astronomico di Torino (Italy)
Gerardo Capobianco, INAF - Osservatorio Astronomico di Torino (Italy)
Silvano Fineschi, INAF - Osservatorio Astronomico di Torino (Italy)


Published in SPIE Proceedings Vol. 8777:
Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III
Libor Juha; Saša Bajt; Richard London; René Hudec; Ladislav Pina, Editor(s)

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