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Proceedings Paper

A CMOS-compatible silicon photonic platform for high-speed integrated opto-electronics
Author(s): Christophe Galland; Ari Novack; Yang Liu; Ran Ding; Michael Gould; Tom Baehr-Jones; Qi Li; Yisu Yang; Yangjin Ma; Yi Zhang; Kishore Padmaraju; Keren Bergmen; Andy Eu-Jin Lim; Guo-Qiang Lo; Michael Hochberg
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Paper Abstract

We have developed a CMOS-compatible Silicon-on-Insulator photonic platform featuring active components such as pi- n and photoconductive (MIM) Ge-on-Si detectors, p-i-n ring and Mach-Zehnder modulators, and traveling-wave modulators based on a p-n junction driven by an RF transmission line. We have characterized the yield and uniformity of the performance through automated cross-wafer testing, demonstrating that our process is reliable and scalable. The entire platform is capable of more than 40 GB/s data rate. Fabricated at the IME/A-STAR foundry in Singapore, it is available to the worldwide community through OpSIS, a successful multi-project wafer service based at the University of Delaware. After exposing the design, fabrication and performance of the most advanced platform components, we present our newest results obtained after the first public run. These include low loss passives (Y-junctions: 0.28 dB; waveguide crossings: 0.18 dB and cross-talk -41±2 dB; non-uniform grating couplers: 3.2±0.2 dB). All these components were tested across full 8” wafers and exhibited remarkable uniformity. The active devices were improved from the previous design kit to exhibit 3dB bandwidths ranging from 30 GHz (modulators) to 58 GHz (detectors). We also present new packaging services available to OpSIS users: vertical fiber coupling and edge coupling.

Paper Details

Date Published: 22 May 2013
PDF: 8 pages
Proc. SPIE 8767, Integrated Photonics: Materials, Devices, and Applications II, 87670G (22 May 2013); doi: 10.1117/12.2017053
Show Author Affiliations
Christophe Galland, Univ. of Delaware (United States)
Ari Novack, A*STAR Institute of Microelectronics (Singapore)
National Univ. of Singapore (Singapore)
Yang Liu, Univ. of Delaware (United States)
Ran Ding, Univ. of Delaware (United States)
Michael Gould, Univ. of Washington (United States)
Tom Baehr-Jones, Univ. of Delaware (United States)
Qi Li, Columbia Univ. (United States)
Yisu Yang, Univ. of Delaware (United States)
Yangjin Ma, Univ. of Delaware (United States)
Yi Zhang, Univ. of Delaware (United States)
Kishore Padmaraju, Columbia Univ. (United States)
Keren Bergmen, Columbia Univ. (United States)
Andy Eu-Jin Lim, A*STAR Institute of Microelectronics (Singapore)
Guo-Qiang Lo, A*STAR Institute of Microelectronics (Singapore)
Michael Hochberg, Univ. of Delaware (United States)
A*STAR Institute of Microelectronics (Singapore)
National Univ. of Singapore (Singapore)


Published in SPIE Proceedings Vol. 8767:
Integrated Photonics: Materials, Devices, and Applications II
Jean-Marc Fédéli; Laurent Vivien; Meint K. Smit, Editor(s)

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