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Proceedings Paper

Determination of the uncertainty for phase noise delivered by an optoelectronic based system
Author(s): Patrice Salzenstein; Ekaterina Pavlyuchenko
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Paper Abstract

The aim of this work is to determine the uncertainty on phase noise results obtained by using a double delay line optoelectronic system operating at 1.55 μm wavelength and designed for microwave photonics applications. The use of cross-correlation increases the noise floor of the system. We present how the phase noise is determined and how the global uncertainty of this system is calculated according to the main guideline delivered by the Bureau International des Poids et Mesures (BIPM). Its leads to a global uncertainty better than 2 dB at 2 sigma.

Paper Details

Date Published: 8 May 2013
PDF: 4 pages
Proc. SPIE 8772, Nonlinear Optics and Applications VII, 877217 (8 May 2013); doi: 10.1117/12.2016886
Show Author Affiliations
Patrice Salzenstein, CNRS, Institut Franche Comté Electronique Thermique Optique Sciences et Technologie (France)
Ekaterina Pavlyuchenko, CNRS, Institut Franche Comté Electronique Thermique Optique Sciences et Technologie (France)


Published in SPIE Proceedings Vol. 8772:
Nonlinear Optics and Applications VII
Mario Bertolotti; Joseph Haus; Alexei M. Zheltikov, Editor(s)

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