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Proceedings Paper

Spectral filtering optimization of a measuring channel of an x-ray broadband spectrometer
Author(s): B. Emprin; Ph. Troussel; B. Villette; F. Delmotte
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Paper Abstract

A new channel of an X-ray broadband spectrometer has been developed for the 2 – 4 keV spectral range. It uses a spectral filtering by using a non-periodic multilayer mirror. This channel is composed by a filter, an aperiodic multilayer mirror and a detector. The design and realization of the optical coating mirror has been defined such as the reflectivity is above 8% in almost the entire bandwidth range 2 – 4 keV and lower than 2% outside. The mirror is optimized for working at 1.9° grazing incidence. The mirror is coated with a stack of 115 chromium / scandium (Cr / Sc) non-periodic layers, between 0.6 nm and 7.3 nm and a 3 nm thick top SiO2 layer to protect the stack from oxidization. To control thin thicknesses, we produced specific multilayer mirrors which consist on a superposition of two periodic Cr / Sc multilayers with the layer to calibrate in between. The mirror and subnanometric layers characterizations were made at the “Laboratoire Charles Fabry” (LCF) with a grazing incidence reflectometer working at 8.048 keV (Cu Kα radiation) and at the synchrotron radiation facility SOLEIL on the hard X-ray branch of the “Metrology” beamline. The reflectivity of the mirrors as a function of the photon energy was obtained in the Physikalisch Technische Bundesanstalt (PTB) laboratory at the synchrotron radiation facility Bessy II.

Paper Details

Date Published: 3 May 2013
PDF: 6 pages
Proc. SPIE 8777, Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III, 87771B (3 May 2013); doi: 10.1117/12.2016832
Show Author Affiliations
B. Emprin, CEA, Direction des Applications Militaires (France)
Lab. Charles Fabry, CNRS, Institut d'Optique, Univ. Paris Sud (France)
Ph. Troussel, CEA, Direction des Applications Militaires (France)
B. Villette, CEA, Direction des Applications Militaires (France)
F. Delmotte, Lab. Charles Fabry, CNRS, Institut d'Optique, Univ. Paris Sud (France)


Published in SPIE Proceedings Vol. 8777:
Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III
Libor Juha; René Hudec; Ladislav Pina; Saša Bajt; Richard London, Editor(s)

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