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Proceedings Paper

Band gap and correlated phenomena in bilayer and trilayer graphene
Author(s): Yongjin Lee; Kevin Myhro; David Tran; Nathaniel Gilgren; Jairo Velasco; Wenzhong Bao; Michael Deo; Chun Ning Lau
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Paper Abstract

Graphene and its few layer cousins are unique two-dimensional (2D) systems with extraordinary electrical, thermal, mechanical and optical properties, and they have become both fantastic platforms for exploring fundamental processes and some of the most promising material for next generation electronics. Here we present our transport studies of dual gated suspended bilayer and trilayer graphene devices. At the charge neutrality point, application of an electric field induces a gap in bilayer graphene’s band structure. For high mobility bilayer devices, we observe an intrinsic insulating state with a gap of 2-3 meV and a transition temperature ~5K, which arises from electronic interactions. In ABC-stacked trilayer devices, an insulating state with gap ~25 meV is observed. Our results underscore the rich interaction-induced collective states in few layer graphene and suggest a promising direction for THz technology and high speed low dissipation electronic devices.

Paper Details

Date Published: 29 May 2013
PDF: 9 pages
Proc. SPIE 8725, Micro- and Nanotechnology Sensors, Systems, and Applications V, 872506 (29 May 2013); doi: 10.1117/12.2016521
Show Author Affiliations
Yongjin Lee, Univ. of California, Riverside (United States)
Kevin Myhro, Univ. of California, Riverside (United States)
David Tran, Univ. of California, Riverside (United States)
Nathaniel Gilgren, Univ. of California, Riverside (United States)
Jairo Velasco, Univ. of California, Riverside (United States)
Wenzhong Bao, Univ. of California, Riverside (United States)
Michael Deo, Univ. of California, Riverside (United States)
Chun Ning Lau, Univ. of California, Riverside (United States)


Published in SPIE Proceedings Vol. 8725:
Micro- and Nanotechnology Sensors, Systems, and Applications V
Thomas George; M. Saif Islam; Achyut K. Dutta, Editor(s)

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