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Proceedings Paper

Influence of pixel geometry on the 1/f noise coefficient
Author(s): Francis Généreux; Jacques-Edmond Paultre; Bruno Tremblay; Francis Provençal; Christine Alain
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Paper Abstract

This paper presents a systematic study of the 1/f noise coefficient as a function of pixel geometry for microbolometer structures. Structures with various VOx widths, electrode gaps, electrode widths and via hole sizes were fabricated and characterized. The experimental results show that the 1/f noise coefficient is adversely affected by current non uniformity, in agreement with model predictions. Design parameters that significantly impact current non uniformity are identified and approaches to minimize their importance are proposed.

Paper Details

Date Published: 11 June 2013
PDF: 9 pages
Proc. SPIE 8704, Infrared Technology and Applications XXXIX, 87041Q (11 June 2013); doi: 10.1117/12.2016250
Show Author Affiliations
Francis Généreux, INO (Canada)
Jacques-Edmond Paultre, INO (Canada)
Bruno Tremblay, INO (Canada)
Francis Provençal, INO (Canada)
Christine Alain, INO (Canada)


Published in SPIE Proceedings Vol. 8704:
Infrared Technology and Applications XXXIX
Bjørn F. Andresen; Gabor F. Fulop; Charles M. Hanson; Paul R. Norton; Patrick Robert, Editor(s)

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