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Proceedings Paper

Using heatable AFM probes for the nanolithography of graphene, polymers, and nanoparticles
Author(s): Paul E Sheehan; Woo K Lee; William P King
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Date Published:
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Proc. SPIE 8725, Micro- and Nanotechnology Sensors, Systems, and Applications V, 87250Q; doi: 10.1117/12.2016161
Show Author Affiliations
Paul E Sheehan, US Naval Research Lab (United States)
Woo K Lee, US Naval Research Lab (United States)
William P King, University of Illinois, Urbana-Champaign (United States)


Published in SPIE Proceedings Vol. 8725:
Micro- and Nanotechnology Sensors, Systems, and Applications V
Thomas George; M. Saif Islam; Achyut K. Dutta, Editor(s)

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