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Proceedings Paper • Open Access

Implementing STEM technology in a Title One middle school classroom
Author(s): Carolyn Holcomb; Mary Satterfield

Paper Abstract

What do a modern day CSI forensics lab and an electron microscope have in common? It offers the ability to engage students in a scientific investigation, exploring the world of nanotechnology using modern day equipment. 7th grade students at Western Heights Middle School at Hagerstown, MD, used Hitachi’s TM3000 to better understand how technology is utilized when investigating contemporary questions. Using the TM3000, students learned how to load samples, scan, take pictures, and focus the SEM. This experience was an eye opener to students who otherwise would never have had such a learning opportunity. As a result many verbalized interest in pursuing careers in STEM related fields, if only to be able to use such fun equipment. In this session the teacher will present how the instrument was used, and the lessons learned both by the instructor and her students.

Paper Details

Date Published: 29 May 2013
PDF: 4 pages
Proc. SPIE 8729, Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 87290E (29 May 2013); doi: 10.1117/12.2016152
Show Author Affiliations
Carolyn Holcomb, Western Heights Middle School (United States)
Mary Satterfield, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 8729:
Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
Michael T. Postek; Dale E. Newbury; S. Frank Platek; Tim K. Maugel, Editor(s)

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