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Proceedings Paper

Radiation effects in advanced microelectronic technologies
Author(s): Paul E Dodd; Marty R Shaneyfelt; James R Schwank
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Date Published:
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Proc. SPIE 8725, Micro- and Nanotechnology Sensors, Systems, and Applications V, ; doi: 10.1117/12.2015884
Show Author Affiliations
Paul E Dodd, Sandia National Laboratories (United States)
Marty R Shaneyfelt, Sandia National Laboratories (United States)
James R Schwank, Sandia National Laboratories (United States)


Published in SPIE Proceedings Vol. 8725:
Micro- and Nanotechnology Sensors, Systems, and Applications V
Thomas George; M. Saif Islam; Achyut K. Dutta, Editor(s)

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