
Proceedings Paper
A method to identify material based on spectrum analysesFormat | Member Price | Non-Member Price |
---|---|---|
$14.40 | $18.00 |
![]() |
GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. | Check Access |
Paper Abstract
According to radiation temperature measurement theory, the key of temperature measurement is to choose the appropriate temperature model, which depends on the type of measured material. So how to identify the material type is significant to measure its surface temperature. Different materials have different spectral characters at the same temperature. In this paper, a method based on spectrum analysis is proposed to identify material. The spectrum of four kinds of materials is measured using Fourier transform infrared spectrometer (FTIR) at the same temperature 873K. The peak values extracted from each spectrum are used to train the identification algorithm. Then one material is chosen from the measured materials to verify the identification algorithm if the type of material can be identified. The experimental results suggest that the new method based on spectrum analyses can accurately identify the type of material.
Paper Details
Date Published: 31 January 2013
PDF: 8 pages
Proc. SPIE 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation, 87590C (31 January 2013); doi: 10.1117/12.2015042
Published in SPIE Proceedings Vol. 8759:
Eighth International Symposium on Precision Engineering Measurement and Instrumentation
Jie Lin, Editor(s)
PDF: 8 pages
Proc. SPIE 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation, 87590C (31 January 2013); doi: 10.1117/12.2015042
Show Author Affiliations
L. Zhang, Harbin Institute of Technology (China)
J. M. Dai, Harbin Institute of Technology (China)
Y. F. Zhang, Harbin Institute of Technology (China)
J. M. Dai, Harbin Institute of Technology (China)
Y. F. Zhang, Harbin Institute of Technology (China)
Published in SPIE Proceedings Vol. 8759:
Eighth International Symposium on Precision Engineering Measurement and Instrumentation
Jie Lin, Editor(s)
© SPIE. Terms of Use
