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Proceedings Paper

High-precision gasket thickness measuring and classifying system based on line-structured light
Author(s): Qinghua Wu; Tao He; Tielin Shi
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Paper Abstract

In this paper, a high-precision flat gasket thickness measuring and classifying system based on line-structured light is presented. The system consists of a part feeding device, a measurement platform, a measurement and control subsystem and a classifying subsystem. The measurement system is based on the optical trigonometry measurement principle. Different from other common measurement system, a line-structured light instead of a beam is projected to the surface of the measured object. From a stripe the measured result will get more confirmation than a single beam spot. More than one frame of image are grabbed and averaged to reduce the random error. The gravity center algorithm is used to extract the center-point of the stripe in one column. According to the least squares method, a straight line can be fitted from gravity center-points extracted. A virtual grate is designed to improve the resolution of the measurement system. The calibration of the measurement system is designed and realized. An experiment is built and the measurement result is analyzed. The result shows that the uncertainty of the measurement system is limited in ± 0.003mm. And this system can be used for classifying the gaskets by thickness.

Paper Details

Date Published: 31 January 2013
PDF: 7 pages
Proc. SPIE 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation, 87593U (31 January 2013); doi: 10.1117/12.2014802
Show Author Affiliations
Qinghua Wu, Huazhong Univ. of Science and Technology (China)
Hubei Univ. of Technology (China)
Key Lab. of Advanced Manufacture and Quality Engineering (China)
Tao He, Hubei Univ. of Technology (China)
Key Lab. of Advanced Manufacture and Quality Engineering (China)
Tielin Shi, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 8759:
Eighth International Symposium on Precision Engineering Measurement and Instrumentation
Jie Lin, Editor(s)

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