Share Email Print
cover

Proceedings Paper

Filtering method for phase fringe patterns in the digital speckle pattern interferometry
Author(s): Yonghong Wang; Weihua Bu; Junrui Li; Jianfei Sun; Lianxiang Yang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The phase fringe patterns obtained by the phase shifting technique are inherently full of speckle noise in Digital Speckle Pattern Interferometry (DSPI),. The phase fringe patterns filtering method is very important to obtain the precisely deformation information. In this paper a effective method for filtering the speckle noise of phase fringe patterns is applied, the method filter the discrete images which generated from phase fringe patterns instead of classical filtering phase fringe patterns directly. Comparing with existed filters method, it has a better performance on phase jump information preservation and does not have any blurring effect on the phase distribution providing the filtering is implemented on the equal-phase window. Moreover, its capability of noise reduction is more powerful. An optical measurement system based on DSPI is built to demonstrate the filtering method, and the experiment results have shown the effectiveness and advantages of the filter method.

Paper Details

Date Published: 31 January 2013
PDF: 6 pages
Proc. SPIE 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation, 87592A (31 January 2013); doi: 10.1117/12.2014792
Show Author Affiliations
Yonghong Wang, Hefei Univ. of Technology (China)
Weihua Bu, Hefei Univ. of Technology (China)
Junrui Li, Hefei Univ. of Technology (China)
Jianfei Sun, Hefei Univ. of Technology (China)
Lianxiang Yang, Hefei Univ. of Technology (China)
Oakland Univ. (United States)


Published in SPIE Proceedings Vol. 8759:
Eighth International Symposium on Precision Engineering Measurement and Instrumentation
Jie Lin, Editor(s)

© SPIE. Terms of Use
Back to Top