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Proceedings Paper

Quality control in the recycling stream of PVC from window frames by hyperspectral imaging
Author(s): Valentina Luciani; Silvia Serranti; Giuseppe Bonifazi; Francesco Di Maio; Peter Rem
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Paper Abstract

Polyvinyl chloride (PVC) is one of the most commonly used thermoplastic materials in respect to the worldwide polymer consumption. PVC is mainly used in the building and construction sector, products such as pipes, window frames, cable insulation, floors, coverings, roofing sheets, etc. are realised utilising this material. In recent years, the problem of PVC waste disposal gained increasing importance in the public discussion. The quantity of used PVC items entering the waste stream is gradually increased as progressively greater numbers of PVC products approach to the end of their useful economic lives. The quality of the recycled PVC depends on the characteristics of the recycling process and the quality of the input waste. Not all PVC-containing waste streams have the same economic value. A transparent relation between value and composition is required to decide if the recycling process is cost effective for a particular waste stream. An objective and reliable quality control technique is needed in the recycling industry for the monitoring of both recycled flow streams and final products in the plant. In this work hyperspectral imaging technique in the near infrared (NIR) range (1000-1700 nm) was applied to identify unwanted plastic contaminants and rubber present in PVC coming from windows frame waste in order to assess a quality control procedure during its recycling process. Results showed as PVC, PE and rubber can be identified adopting the NIR-HSI approach.

Paper Details

Date Published: 3 May 2013
PDF: 11 pages
Proc. SPIE 8774, Optical Sensors 2013, 87741N (3 May 2013); doi: 10.1117/12.2014755
Show Author Affiliations
Valentina Luciani, Univ. degli Studi di Roma La Sapienza (Italy)
Silvia Serranti, Univ. degli Studi di Roma La Sapienza (Italy)
Giuseppe Bonifazi, Univ. degli Studi di Roma La Sapienza (Italy)
Francesco Di Maio, Technische Univ. Delft (Netherlands)
Peter Rem, Technische Univ. Delft (Netherlands)


Published in SPIE Proceedings Vol. 8774:
Optical Sensors 2013
Francesco Baldini; Jiri Homola; Robert A. Lieberman, Editor(s)

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