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Proceedings Paper

Second-harmonic generation from complex chiral samples
Author(s): M. Vanbel; S. Vandendriessche; M. A. van der Veen; D. Slavov; P. Heister; R. Paesen; V. K. Valev; M. Ameloot; T. Verbiest
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Paper Abstract

Second harmonic generation microscopy has recently become an important tool for studying materials. In this article, we use a recently developed analytical method, for second-harmonic generation microscopy, to determine the point group symmetry of micro crystals of enantiomerically pure 1,1’-bi-2-naphtol.

Paper Details

Date Published: 15 March 2013
PDF: 7 pages
Proc. SPIE 8770, 17th International School on Quantum Electronics: Laser Physics and Applications, 87701F (15 March 2013); doi: 10.1117/12.2014745
Show Author Affiliations
M. Vanbel, Univ. of Leuven (Belgium)
S. Vandendriessche, Univ. of Leuven (Belgium)
M. A. van der Veen, Univ. of Leuven (Belgium)
D. Slavov, Institute of Electronics (Bulgaria)
P. Heister, Technische Univ. München (Germany)
R. Paesen, Transnational Univ. Limburg (Belgium)
Univ. Hasselt (Belgium)
V. K. Valev, Katholieke Univ. Leuven (Belgium)
M. Ameloot, Transnational Univ. Limburg (Belgium)
Univ. Hasselt (Belgium)
T. Verbiest, Katholieke Univ. Leuven (Belgium)


Published in SPIE Proceedings Vol. 8770:
17th International School on Quantum Electronics: Laser Physics and Applications
Tanja N. Dreischuh; Albena T. Daskalova, Editor(s)

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