Share Email Print
cover

Proceedings Paper

Evaluation of Spatial Straightness Error using LaserTRACER
Author(s): Mingzhao He; Xiaoyou Ye; Jianshuang Li; Xiaochuan Gan
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In order to improve the evaluation precision of spatial straightness error, new measurement setup using 4 LaserTRACERs were built at National Institute of Metrology (NIM). The LaserTRACER is a length measurement device with sub-micron accuracy. In principle, the LaserTRACER is a traceable interferometer. Experiment was implemented on a granite rail with air-suspending slider to test the spatial straightness of the rail. In the experiment, the retroreflector was mounted on slider and moves alone the rail after the spatial frame of axes was built. Using 4 LaserTRACERs, the spatial coordinates can be calculated by Multilateration algorithm. The optimal arrangement of LaserTRACERs is studied by simulation and experiment. The mathematical model based on GBT11336-2004 was built, and Least squares method is used in the spatial line fitting. The measurement principle and results were verified by comparison with SpatialAnalyzer and Metrolog XG.

Paper Details

Date Published: 31 January 2013
PDF: 5 pages
Proc. SPIE 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation, 87593S (31 January 2013); doi: 10.1117/12.2014642
Show Author Affiliations
Mingzhao He, National Institute of Metrology (China)
Xiaoyou Ye, National Institute of Metrology (China)
Jianshuang Li, National Institute of Metrology (China)
Xiaochuan Gan, National Institute of Metrology (China)


Published in SPIE Proceedings Vol. 8759:
Eighth International Symposium on Precision Engineering Measurement and Instrumentation
Jie Lin, Editor(s)

© SPIE. Terms of Use
Back to Top