Proceedings Paper
3D measurement based on phase-shift and self-calibration| Format | Member Price | Non-Member Price |
|---|---|---|
| $14.40 | $18.00 |
|
GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. | Check Access |
Paper Abstract
Non-contact three-dimension (3D) measurement technology has developed rapidly. Digital grating projection is regarded as the best prospect one. There are many problems, such as low accuracy, which have not been solved yet. Based on digital grating phase-shift, and combed with height-phase mapping and self lattice calibrating, a new 3D measurement method has been proposed. With little geometric constraints to digital grating and CCD, the measurement system is more feasible, which can be used to realize the accurate measurement and reconstruction according to the 3D information from measured object. By applying the method proposed to a reference object, the experience has lead to good result which shows that the new method is efficient and precision.
Paper Details
Date Published: 31 January 2013
PDF: 5 pages
Proc. SPIE 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation, 87591A (31 January 2013); doi: 10.1117/12.2014579
Published in SPIE Proceedings Vol. 8759:
Eighth International Symposium on Precision Engineering Measurement and Instrumentation
Jie Lin, Editor(s)
PDF: 5 pages
Proc. SPIE 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation, 87591A (31 January 2013); doi: 10.1117/12.2014579
Show Author Affiliations
Liangzhou Chen, Huazhong Univ. of Science and Technology (China)
Yongjie Xu, Huazhong Univ. of Science and Technology (China)
Yongjie Xu, Huazhong Univ. of Science and Technology (China)
Dan Xiao, Huazhong Univ. of Science and Technology (China)
Published in SPIE Proceedings Vol. 8759:
Eighth International Symposium on Precision Engineering Measurement and Instrumentation
Jie Lin, Editor(s)
© SPIE. Terms of Use
