Share Email Print
cover

Proceedings Paper

Ultrasonic array imaging in nondestructive evaluation: total focusing method with using circular coherence factor
Author(s): Jie Zhang; Bruce W. Drinkwater; Paul D. Wilcox
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Ultrasonic array imaging algorithms have been widely used and developed in non-destructive evaluation in the last 10 years. In this paper, a widely-used imaging algorithms, Total Focusing Method (TFM), was further developed with using the phase statistical information of the scattering field from a scatterer, i.e., Circular Coherence Factor (CCF). TFM and TFM with using CCF are compared through both simulation and experimental measurements. In the simulation, array data sets were generated by using a hybrid forward model containing a single defect amongst a multitude of randomly distributed point scatterers to represent backscatter from material microstructure. The number of point scatterers per unit area and their scattering amplitude were optimized to reduce computation cost. The Signal to Noise Ratio (SNR) of the finial images and their resolution were used to indicate the quality of the different imaging algorithms. The images of different types of defect (point reflectors and planar cracks) were used to investigate the robustness of the imaging algorithms. It is shown that, with using CCF, higher image resolution can be achieved, but that the images of cracks are distorted. It is also shown that the detection limit of the imaging algorithms is almost equal for weakly scattering defects.

Paper Details

Date Published: 31 January 2013
PDF: 8 pages
Proc. SPIE 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation, 87592N (31 January 2013); doi: 10.1117/12.2014569
Show Author Affiliations
Jie Zhang, Univ. of Bristol (United Kingdom)
Bruce W. Drinkwater, Univ. of Bristol (United Kingdom)
Paul D. Wilcox, Univ. of Bristol (United Kingdom)


Published in SPIE Proceedings Vol. 8759:
Eighth International Symposium on Precision Engineering Measurement and Instrumentation
Jie Lin, Editor(s)

© SPIE. Terms of Use
Back to Top