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Proceedings Paper

Constrained simultaneous stitching measurement for aspheric surface
Author(s): Weibo Wang; Zhigang Fan
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Paper Abstract

Significant errors could be result from multiple data sets due to error transfer and accumulation in each sub-aperture. The constrained simultaneous stitching method with error calibration is proposed to increase the stability of the numerical solution of the stitching algorithm. Global averaging error and constrained optimization are applied to simultaneous stitching after alignment errors calibrated. The goal of optimization and merit function is the minimization of the discrepancy between multiple data sets by including components related to various alignment errors. The values for stitching coefficients that fall within the unit sphere and minimize the mean square difference between and overlapping values can be found by iterative constrained optimization. At last, the full aperture wave-front was reconstructed by simultaneous stitching with the stitching coefficients required to remain within meaningful bounds.

Paper Details

Date Published: 31 January 2013
PDF: 5 pages
Proc. SPIE 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation, 875923 (31 January 2013); doi: 10.1117/12.2014563
Show Author Affiliations
Weibo Wang, Harbin Institute of Technology (China)
Zhigang Fan, Harbin Institute of Technology (China)


Published in SPIE Proceedings Vol. 8759:
Eighth International Symposium on Precision Engineering Measurement and Instrumentation
Jie Lin, Editor(s)

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