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Proceedings Paper

Porcelain three-dimensional shape reconstruction and its color reconstruction
Author(s): Xiaoyang Yu; Haibin Wu; Xue Yang; Shuang Yu; Beiyi Wang; Deyun Chen
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Paper Abstract

In this paper, structured light three-dimensional measurement technology was used to reconstruct the porcelain shape, and further more the porcelain color was reconstructed. So the accurate reconstruction of the shape and color of porcelain was realized. Our shape measurement installation drawing is given. Because the porcelain surface is color complex and highly reflective, the binary Gray code encoding is used to reduce the influence of the porcelain surface. The color camera was employed to obtain the color of the porcelain surface. Then, the comprehensive reconstruction of the shape and color was realized in Java3D runtime environment. In the reconstruction process, the space point by point coloration method is proposed and achieved. Our coloration method ensures the pixel corresponding accuracy in both of shape and color aspects. The porcelain surface shape and color reconstruction experimental results completed by proposed method and our installation, show that: the depth range is 860 ∼ 980mm, the relative error of the shape measurement is less than 0.1%, the reconstructed color of the porcelain surface is real, refined and subtle, and has the same visual effect as the measured surface.

Paper Details

Date Published: 31 January 2013
PDF: 6 pages
Proc. SPIE 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation, 875913 (31 January 2013); doi: 10.1117/12.2014456
Show Author Affiliations
Xiaoyang Yu, Harbin Univ. of Science and Technology (China)
Haibin Wu, Harbin Univ. of Science and Technology (China)
Xue Yang, Harbin Univ. of Science and Technology (China)
Shuang Yu, Harbin Univ. of Science and Technology (China)
Beiyi Wang, Harbin Univ. of Science and Technology (China)
Deyun Chen, Harbin Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 8759:
Eighth International Symposium on Precision Engineering Measurement and Instrumentation
Jie Lin, Editor(s)

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