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Proceedings Paper

Speckle suppression in pattern projection profilometry with a thin sinusoidal phase grating by polychromatic illumination
Author(s): Nataliya Berberova; Elena Stoykova; Joo Sup Park; Hoonjong Kang; Ventseslav Sainov
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Paper Abstract

Pattern projection profilometry is a powerful tool to reconstruct three-dimensional (3D) surface of diffuse objects. A variety of pattern projection methods for 3D capture of objects is based on the generation of sinusoidal fringes. A sinusoidal phase grating under divergent coherent illumination with a point source produces high visibility and high spectral purity sinusoidal fringes in a large longitudinal region. In the present work we study the speckle suppression in the fringes by using a polychromatic light source. Such an approach makes use of the fact that the lateral fringe spacing does not depend on the wavelength of the illuminating light. The wavelength has an impact on the locations and the number of the Talbot planes, where self-imaging of the grating occurs, and on variation of the contrast and the frequency content of fringes along the distance from the grating. We analyze the multi-wavelength illumination of the grating by solving the Fresnel diffraction integral for a point source illumination in paraxial approximation. We verified the obtained results by experiments with a thin holographic grating recorded on a silver-halide holographic plate under illumination with a laser diode operating in single mode and multimode regimes.

Paper Details

Date Published: 15 March 2013
PDF: 10 pages
Proc. SPIE 8770, 17th International School on Quantum Electronics: Laser Physics and Applications, 87700R (15 March 2013); doi: 10.1117/12.2013644
Show Author Affiliations
Nataliya Berberova, Institute of Optical Materials and Technologies (Bulgaria)
Elena Stoykova, Institute of Optical Materials and Technologies (Bulgaria)
Korea Electronics Technology Institute (Korea, Republic of)
Joo Sup Park, Korea Electronics Technology Institute (Korea, Republic of)
Hoonjong Kang, Korea Electronics Technology Institute (Korea, Republic of)
Ventseslav Sainov, Institute of Optical Materials and Technologies (Bulgaria)


Published in SPIE Proceedings Vol. 8770:
17th International School on Quantum Electronics: Laser Physics and Applications
Tanja N. Dreischuh; Albena T. Daskalova, Editor(s)

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