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Proceedings Paper

A NIR scene simulation method based on reflection properties of target
Author(s): Huilei Yang; Yan Ding; Zhemin Zhang
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Paper Abstract

In this paper, the spectral reflectance which ranges from 780nm to 1100nm for some typical targets is measured by using spectroradiometer. After the reflection properties analyzing, a near infrared (NIR) scene simulation method based on reflection properties of the typical target is presented. The experiment result shows the global features of NIR scene and laid the foundation of NIR scene simulation in future.

Paper Details

Date Published: 13 March 2013
PDF: 6 pages
Proc. SPIE 8783, Fifth International Conference on Machine Vision (ICMV 2012): Computer Vision, Image Analysis and Processing, 87830A (13 March 2013); doi: 10.1117/12.2012448
Show Author Affiliations
Huilei Yang, Beijing Institute of Technology (China)
Yan Ding, Beijing Institute of Technology (China)
Zhemin Zhang, Beijing Aoptek Scientific Co. Ltd. (China)


Published in SPIE Proceedings Vol. 8783:
Fifth International Conference on Machine Vision (ICMV 2012): Computer Vision, Image Analysis and Processing
Yulin Wang; Liansheng Tan; Jianhong Zhou, Editor(s)

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