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Proceedings Paper

Parametric definition for the CGH patterns and error analysis in interferometric measurements
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Paper Abstract

Computer-generated holograms are often used to test aspheric surfaces. This paper provides a parametric model for the CGH phase function using the exact geometric model. The phase function is then used to derive the sensitivity functions to alignment errors in testing. When using the CGH to test aspheric surface, it is important to separate the diffraction orders and only allow the desired order to pass the system. This paper also provides a recipe for determining the amount of carriers needed to eliminate the ghost images.

Paper Details

Date Published: 15 October 2012
PDF: 10 pages
Proc. SPIE 8415, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 841505 (15 October 2012); doi: 10.1117/12.2010725
Show Author Affiliations
Ping Zhou, College of Optical Sciences, The Univ. of Arizona (United States)
Wenrui Cai, College of Optical Sciences, The Univ. of Arizona (United States)
Chunyu Zhao, College of Optical Sciences, The Univ. of Arizona (United States)
James H. Burge, College of Optical Sciences, The Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 8415:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes
Wenhan Jiang; Myung K. Cho; Fan Wu, Editor(s)

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